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SN74BCT8374ADWR

SN74BCT8374ADWR
Mfr. #:
SN74BCT8374ADWR
Сипаттама:
IC SCAN TEST DEVICE W/FF 24-SOIC
Өміршеңдік кезең:
Осы өндірушіден жаңа.
Деректер тізімі:
SN74BCT8374ADWR Деректер тізімі
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SN74BCT8374ADWR Көбірек ақпарат SN74BCT8374ADWR Product Details
Өнім атрибуты
Төлсипат мәні
Tags
SN74BCT8374AD, SN74BCT8374A, SN74BCT8374, SN74BCT83, SN74BCT8, SN74B, SN74, SN7
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We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***C
Flip Flop D-Type Bus Interface Pos-Edge 3-ST 1-Element 24-Pin SOIC T/R
***ark
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-SOIC; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
***as Instruments
The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F374 and 'BCT374 octal D-type flip-flops. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal flip-flops. In the test mode, the normal operation of the SCOPETM octal flip-flops is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8374A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8374A is characterized for operation from 0°C to 70°C.
Бөлім № Сипаттама Қор Бағасы
SN74BCT8374ADWR
DISTI # SN74BCT8374ADWR-ND		IC SCAN TEST DEVICE W/FF 24-SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)		Limited Supply - Call
    SN74BCT8374ADWRE4
    DISTI # SN74BCT8374ADWRE4-ND    		IC SCAN TEST DEVICE W/FF 24-SOIC
    RoHS: Compliant
    Min Qty: 2000
    Container: Tape & Reel (TR)    		Limited Supply - Call
      SN74BCT8374ADWRG4
      DISTI # SN74BCT8374ADWRG4-ND      		IC SCAN TEST DEVICE 24SOIC
      RoHS: Compliant
      Min Qty: 2000
      Container: Tape & Reel (TR)      		Limited Supply - Call
        SN74BCT8374ADWRE4
        DISTI # SN74BCT8374ADWRE4        		- Bulk (Alt: SN74BCT8374ADWRE4)
        Min Qty: 1
        Container: Bulk        		Americas - 0
          SN74BCT8374ADWR
          DISTI # 595-SN74BCT8374ADWR          		Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop
          RoHS: Compliant          		0
            SN74BCT8374ADWRE4
            DISTI # 595-SN74BCT8374ADWRE            		Specialty Function Logic Fixed LDO Volt Reg
            RoHS: Compliant            		0
              SN74BCT8374ADWRG4
              DISTI # 595-74BCT8374ADWRG4              		Specialty Function Logic Scan Test Device
              RoHS: Compliant              		0
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                		 Жаңа және түпнұсқа
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                		 Жаңа және түпнұсқа
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                OMO.#: OMO-SN74BCT2414N-TEXAS-INSTRUMENTS

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                OMO.#: OMO-SN74BCT8244ADWE4-TEXAS-INSTRUMENTS

                		 Specialty Function Logic Device w/Octal Buffers
                Қол жетімділік
                Қор:
                Available
                Тапсырыс бойынша:
                3000
                Саны енгізіңіз:
                SN74BCT8374ADWR ағымдағы бағасы тек анықтама үшін берілген, егер сіз ең жақсы бағаны алғыңыз келсе, сату тобымызға [email protected] мекенжайына сұрауды немесе тікелей электрондық поштаны жіберіңіз.
                Анықтамалық баға (USD)
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                1
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                0,00 $
                10
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                0,00 $
                100
                0,00 $
                0,00 $
                500
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                1000
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                0,00 $
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